Updated 2008 Jul 28.

Patents registered in USA:

US 6,441,371 Scanning probe microscope
US 6,615,640 B2 Fine friction and wear test apparatus for plate specimen
US 2002/0062678 A1 Fine friction and wear testing apparatus

Patents and applications registered in Republic of Korea:

20030000282 Fine friction and wear test apparatus for plate specimen
20020062678 Fine friction and wear testing apparatus
1019990016708 Step motor controlling system
1020060065261 Electromagnetic driving apparatus generating linearly reciprocating movement, capable of controlling electromagnet with high resolution in displacement of two ranges by using sensor connected to close loop system

Patents registered in Japan:

2002202244 Experimental device for minute frictional wear
2003042920 Fine friction and wear test apparatus for plate specimen

In 2007 the patent application in Republic of Korea has submitted by TFS Global Co., Ltd: "Atomic force microscope having variable stiffness probe" where the probe design which rigidity can change over a wide range for the purpose of scanning of surfaces and research of their mechanical properties by a method of nanoindentation has described.

In 2008 the patent application in Republic Korea has submitted by TFS Global Co., Ltd: "Ultrasonic parking sensor" where design of the sensor used at cars parking lots has described.